Susceptibility of ICs to Conducted Electromagnetic Interference
نویسنده
چکیده
This work is focused on the susceptibility of integrated circuits (ICs) to electromagnetic interference (EMI). The main issue is simulation and measurement on device level and circuit level. The work gives an overview of the overall electromagnetic compatibility (EMC) issues, and shows Direct Power Injection (DPI) measurement technique for conducted electromagnetic interference. Related research that is concerned with simulations, measurements and improvement of ICs against EMI is presented. Finally future work and concepts are discussed.
منابع مشابه
20. Electromagnetic Compatibility for Integrated Circuits
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